Scanning Kelvin probe system

Measurement of surface potential of organic compounds, determination of work function of metals and Fermi level of inorganic semiconductors

• Measurement capability: two-dimensional surface potential measurements
• Surface potential measurement range: –9,6 to 9,6 V
• Work function resolution: 1-3meV
• Tip size: 2mm diameter
• Max. scan area: 50mm x 50 mm
• Position resolution: 318 nm
• Sample stage control: manual and auto
• Maximum thickness of sample: 20mm